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过氧化(2-乙基己基)碳酸叔戊酯 | 70833-40-8

中文名称
过氧化(2-乙基己基)碳酸叔戊酯
中文别名
碳过氧酸-O,O-(1,1-二甲基丙基)-O-(2-乙基己基)酯;过氧化(2-乙基己基)碳酸特戊酯;叔戊基过氧化碳酸异辛酯;TAEC;过氧化-2-乙基己基碳酸叔戊酯
英文名称
t-Amyl 2-Ethylhexyl peroxycarbonate
英文别名
OO-t-amyl-O-(2-ethylhexyl)monoperoxycarbonate;tert-Amyl peroxy 2-ethylhexyl carbonate;2-ethylhexyl 2-methylbutan-2-yloxy carbonate
过氧化(2-乙基己基)碳酸叔戊酯化学式
CAS
70833-40-8
化学式
C14H28O4
mdl
——
分子量
260.374
InChiKey
HTCRKQHJUYBQTK-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

物化性质

  • 沸点:
    290℃
  • 密度:
    0.931 g/mL at 25 °C(lit.)
  • 闪点:
    64 °C
  • LogP:
    2.9-5.8 at 20-25℃
  • 物理描述:
    Liquid

计算性质

  • 辛醇/水分配系数(LogP):
    5.2
  • 重原子数:
    18
  • 可旋转键数:
    11
  • 环数:
    0.0
  • sp3杂化的碳原子比例:
    0.93
  • 拓扑面积:
    44.8
  • 氢给体数:
    0
  • 氢受体数:
    4

安全信息

  • 危险品标志:
    O,Xi
  • 安全说明:
    S14,S17,S26,S36/37/39,S47,S7
  • 危险类别码:
    R7,R36/38,R8,R38
  • 危险品运输编号:
    UN 3105 5.2

SDS

SDS:c1cc95671c83fff8fe949fc794bed72b
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反应信息

  • 作为产物:
    描述:
    特戊基过氧化氢氯甲酸-2-乙基己酯吡啶 、 sodium hydroxide 作用下, 反应 3.0h, 生成 过氧化(2-乙基己基)碳酸叔戊酯
    参考文献:
    名称:
    高纯度过氧化-2-乙基己基碳酸叔戊酯的合成和提纯方法
    摘要:
    本发明属于过氧化、有机合成和过氧化物提纯领域,尤其涉及了一种过氧化‑2乙基己基碳酸叔戊酯的合成和提纯方法,包括过氧化反应、取代合成反应和过氧化物的提纯等步骤。本发明减少了废液的排放和后继废液的处理成本,反应条件容易控制,产品收率高,产品纯度高,纯度可达到97%以上。
    公开号:
    CN112300045A
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文献信息

  • Fluorinated vinyl ethers, copolymers thereof, and use in lithographic photoresist compositions
    申请人:DiPietro A. Richard
    公开号:US20060287558A1
    公开(公告)日:2006-12-21
    Fluorinated vinyl ethers are provided having the structure of formula (I) the structure of formula (I) wherein at least one of X and Y is a fluorine atom, and L, R 1 , R 2 , R 3 , R 4 are as defined herein. Also provided are copolymers prepared by radical polymerization of (I) and a second monomer that may not be fluorinated. The polymers are useful in lithographic photoresist compositions, particularly chemical amplification resists. In a preferred embodiment, the polymers are substantially transparent to deep ultraviolet (DUV) radiation, and are thus useful in DUV lithographic photoresist compositions. A method for using the composition to generate resist images on a substrate is also provided, i.e., in the manufacture of integrated circuits or the like.
    提供具有结构式(I)的氟化乙烯醚,其中结构式(I)中的X和Y中至少有一个是原子,而L、R1、R2、R3、R4如本文所定义。还提供由(I)和可能不是化的第二单体进行自由基聚合制备的共聚物。这些聚合物在光刻光阻组合物中很有用,特别是化学放大光阻。在一个首选实施例中,这些聚合物对深紫外(DUV)辐射几乎透明,因此在DUV光刻光阻组合物中很有用。还提供一种使用该组合物在基板上生成抗蚀图像的方法,即在集成电路或类似产品的制造中。
  • Process for synthesizing selected organic peroxides
    申请人:ARKEMA FRANCE
    公开号:EP1852418A1
    公开(公告)日:2007-11-07
    The present invention relates to a process for the continuous preparation of selected organic peroxides using plate exchangers having a high heat exchange capacity.
    本发明涉及一种利用具有高热交换能力的板式换热器连续制备选定有机过氧化物的方法。
  • Method for Controlled Free Radical Polymerization or Copolymerization of Methacrylic and/or Methacrylate Monomers or Exclusively Methacrylic and/or Methacrylate Copolymers
    申请人:Couturier Jean-Luc
    公开号:US20080274074A1
    公开(公告)日:2008-11-06
    The invention relates to a method for the polymerization of one or more methacrylate and/or methacrylic monomers, for the synthesis of methacrylate or methacrylic polymers or of exclusively methacrylic and/or methacrylate copolymers, comprising a step of bringing said monomer(s) into contact with one at least of the compounds of formula (I) and (II) below: in which: R 1 and R 2 may represent a phenyl group, R 3 and R 4 may together form an ═N-phenyl group, Z represents a group of formula —CR 8 R 9 R 10 , in which R 8 and R 9 may represent methyl groups and R 10 may represent a —COO-phenyl group.
    本发明涉及一种合成甲基丙烯酸甲酯甲基丙烯酸聚合物或仅为甲基丙烯酸和/或甲基丙烯酸酯共聚物的聚合物的聚合方法,包括将上述单体与以下式(I)和(II)化合物之一中的至少一种接触的步骤:式中:R1和R2可以表示苯基,R3和R4可以共同形成═N-苯基,Z表示式—CR8R9R10的基团,其中R8和R9可以表示甲基基团,而R10可以表示—COO-苯基基团。
  • Copolymer for use in chemical amplification resists
    申请人:——
    公开号:US20030186160A1
    公开(公告)日:2003-10-02
    A copolymer is provided for use in a lithographic photoresist composition, particularly a chemical amplification photoresist. In a preferred embodiment, the copolymer is substantially transparent to deep ultraviolet radiation, i.e., radiation of a wavelength less than 250 nm, including 157 nm, 193 nm and 248 nm radiation, and has improved sensitivity and resolution. In one embodiment, the copolymer is comprised of an &agr;-cyano- or an &agr;-trifluoro-methacrylate monomer unit and a vinyl ether monomer unit. A lithographic photoresist composition containing the fluorinated copolymer is also provided, as is a process for using the composition to generate resist images on a substrate, i.e., in the manufacture of integrated circuits or the like.
    提供一种用于光刻光阻组合物的共聚物,特别是化学增强型光刻光阻。在一个优选实施例中,该共聚物在深紫外辐射下具有相当的透明度,即波长小于250纳米的辐射,包括157纳米、193纳米和248纳米的辐射,并具有改进的灵敏度和分辨率。在一个实施例中,该共聚物由α-基或α-三甲基丙烯酸甲酯单体单元和乙烯醚单体单元组成。还提供了含共聚物的光刻光阻组合物,以及使用该组合物在基板上生成抗蚀图案的工艺,即在集成电路或类似器件的制造中。
  • Substituted norbornene fluoroacrylate copolymers and use thereof lithographic photoresist compositions
    申请人:——
    公开号:US20020102490A1
    公开(公告)日:2002-08-01
    Copolymers prepared by radical polymerization of a substituted norbomene monomer and a fluoromethacrylic acid, fluoromethacrylonitrile, or fluoromethacrylate comonomer are provided. The polymers are useful in lithographic phtoresist compositions, particularly chemical amplification resists. In a preferred embodiment, the polymers are substantially transparent to deep ultraviolet (DUV) radiation, i.e., radiation of a wavelength less than 250 nm, including 157 nm, 193 nm and 248 nm radiation, and are thus useful in DUV lithographic photoresist compositions. A process for using the composition to generate resist images on a substrate is also provided, i.e., in the manufacture of integrated circuits or the like.
    本发明提供了由取代的诺博门单体和甲基丙烯酸甲基丙烯腈甲基丙烯酸酯共聚物通过自由基聚合制备而成。这些聚合物在光刻光阻组分中非常有用,特别是在化学增强光刻光阻中。在首选实施方式中,这些聚合物对深紫外(DUV)辐射,即波长小于250 nm的辐射,包括157 nm、193 nm和248 nm辐射,具有较高的透明度,因此在DUV光刻光阻组分中非常有用。本发明还提供了一种使用该组合物在基板上生成光阻图像的方法,即在集成电路或类似器件的制造中。
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