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(4R)-4-[(10S,13R,17R)-10,13-dimethyl-3,7,12-trioxo-1,2,4,5,6,8,9,11,14,15,16,17-dodecahydrocyclopenta[a]phenanthren-17-yl]pentanoic acid

中文名称
——
中文别名
——
英文名称
(4R)-4-[(10S,13R,17R)-10,13-dimethyl-3,7,12-trioxo-1,2,4,5,6,8,9,11,14,15,16,17-dodecahydrocyclopenta[a]phenanthren-17-yl]pentanoic acid
英文别名
——
(4R)-4-[(10S,13R,17R)-10,13-dimethyl-3,7,12-trioxo-1,2,4,5,6,8,9,11,14,15,16,17-dodecahydrocyclopenta[a]phenanthren-17-yl]pentanoic acid化学式
CAS
——
化学式
C24H34O5
mdl
——
分子量
402.531
InChiKey
OHXPGWPVLFPUSM-NDGTYXLASA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    2.6
  • 重原子数:
    29
  • 可旋转键数:
    4
  • 环数:
    4.0
  • sp3杂化的碳原子比例:
    0.83
  • 拓扑面积:
    88.5
  • 氢给体数:
    1
  • 氢受体数:
    5

反应信息

  • 作为反应物:
    描述:
    (4R)-4-[(10S,13R,17R)-10,13-dimethyl-3,7,12-trioxo-1,2,4,5,6,8,9,11,14,15,16,17-dodecahydrocyclopenta[a]phenanthren-17-yl]pentanoic acid草酰氯N,N-二甲基甲酰胺 作用下, 以 二氯甲烷 为溶剂, 反应 3.0h, 以15.6 g的产率得到(4R)-4-[(10S,13R,17R)-10,13-dimethyl-3,7,12-trioxo-1,2,4,5,6,8,9,11,14,15,16,17-dodecahydrocyclopenta[a]phenanthren-17-yl]pentanoyl chloride
    参考文献:
    名称:
    RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, ACID GENERATOR AND COMPOUND
    摘要:
    一种抗蚀组合物,暴露后产生酸并在酸的作用下在显影液中表现出改变的溶解度,其中包括一种碱性组分(A),在酸的作用下在显影液中表现出改变的溶解度,以及一种产生酸的酸发生组分(B),其中酸发生组分(B)包括一种由下式(b0)表示的化合物(B0-1)(在该式中,Yx01表示双价连接基;n表示1至3的整数;M′m+表示具有价态m的有机阳离子)。
    公开号:
    US20160274458A1
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文献信息

  • RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
    申请人:TOKYO OHKA KOGYO CO., LTD.
    公开号:US20170371241A1
    公开(公告)日:2017-12-28
    A resist composition containing a resin component having a structural unit represented by general formula (a0-1), and a compound represented by general formula (b1). In general formula (a0-1), R is a hydrogen atom, an alkyl group, or a halogenated alkyl group. Va 1 is a divalent hydrocarbon group. n a1 represents an integer of 0 to 2. Ra′ 12 and Ra′ 13 are a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms or a hydrogen atom. Ra′ 14 is a phenyl group, a naphthyl group, or an anthryl group. In general formula (b1), R b1 represents a cyclic hydrocarbon group. Y b1 represents a divalent linking group containing an ester bond. V b1 represents an alkylene group, a fluorinated alkylene group, or a single bond. m is an integer of 1 or more, and M m+ is an m-valent organic cation.
    一种电阻组分,包含具有一般式(a0-1)所代表的结构单元的树脂组分,以及一种由一般式(b1)所代表的化合物。在一般式(a0-1)中,R是氢原子、烷基或卤代烷基。Va1是双价碳氢基团。na1表示0至2的整数。Ra′12和Ra′13是具有1至10个碳原子的单价链饱和碳氢基团或氢原子。Ra′14是苯基、萘基或蒽基。在一般式(b1)中,Rb1代表环烃基。Yb1代表含有酯键的双价连接基团。Vb1代表烷基、氟化烷基或单键。m是1或更多的整数,Mm+是m价有机阳离子。
  • Resist composition and method for forming resist pattern
    申请人:TOKYO OHKA KOGYO CO., LTD.
    公开号:US11204551B2
    公开(公告)日:2021-12-21
    A resist composition containing a resin component having a structural unit represented by general formula (a0-1), and a compound represented by general formula (b1). In general formula (a0-1), R is a hydrogen atom, an alkyl group, or a halogenated alkyl group, Va1 is a divalent hydrocarbon group, na1 represents an integer of 0 to 2, Ya0 is a carbon atom, Xa0 is a group forming a monocyclic aliphatic hydrocarbon group together with Ya0, and Ra00 is an aromatic hydrocarbon group or a specific unsaturated hydrocarbon group. In general formula (b1), Rb1 represents a cyclic hydrocarbon group, Yb1 represents a divalent linking group containing an ester bond, Vb1 represents an alkylene group, a fluorinated alkylene group, or a single bond, and Mm+ is an m-valent organic cation.
    一种抗蚀剂组合物,含有具有通式(a0-1)表示的结构单元的树脂组分和通式(b1)表示的化合物。在通式(a0-1)中,R 是氢原子、烷基或卤代烷基,Va1 是二价烃基,na1 代表 0 至 2 的整数,Ya0 是碳原子,Xa0 是与 Ya0 一起形成单环脂肪族烃基的基团,Ra00 是芳香族烃基或特定的不饱和烃基。通式(b1)中,Rb1 代表环状烃基,Yb1 代表含有酯键的二价连接基团,Vb1 代表亚烷基、氟化亚烷基或单键,Mm+ 是 m 价有机阳离子。
  • Reductive Radical Decarboxylation of Aliphatic Carboxylic Acids
    作者:Ko, Eun Jung、Williams, Craig M.、Savage, G. Paul、Tsanaktsidis, John
    DOI:10.15227/orgsyn.089.0471
    日期:——
  • US9678423B2
    申请人:——
    公开号:US9678423B2
    公开(公告)日:2017-06-13
  • RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, ACID GENERATOR AND COMPOUND
    申请人:TOKYO OHKA KOGYO CO., LTD.
    公开号:US20160274458A1
    公开(公告)日:2016-09-22
    A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, and which includes a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the acid-generator component (B) including a compound (B0-1) represented by general formula (b0) shown below (in the formula, Yx 01 represents a divalent linking group; n represents an integer of 1 to 3; and M′ m+ represents an organic cation having a valency of m.
    一种抗蚀组合物,暴露后产生酸并在酸的作用下在显影液中表现出改变的溶解度,其中包括一种碱性组分(A),在酸的作用下在显影液中表现出改变的溶解度,以及一种产生酸的酸发生组分(B),其中酸发生组分(B)包括一种由下式(b0)表示的化合物(B0-1)(在该式中,Yx01表示双价连接基;n表示1至3的整数;M′m+表示具有价态m的有机阳离子)。
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