between 195 °C and 325 °C. Complexes 1–4 were used as single-source precursors for the deposition of SnS thin films by aerosol-assisted chemical vapor deposition (AACVD) at temperatures from 400 °C to 530 °C. Orthorhombic SnS thin films were deposited from all four complexes at all deposition temperatures. The films were characterized by UV–vis spectroscopy, powder X-ray diffraction (p-XRD), Raman spectroscopy
一系列的二
硫代
氨基甲酸盐[Sn(C 4 H 9)2(S 2 CN(RR')2)2 ](R,R'=乙基(1); R =甲基,R'=丁基(2) ; R,R'=丁基(3); R =甲基,R'=己基(4);以及[Sn(C 6 H 5)2(S 2 CN(RR')2)2 ](R,R' =乙基(5); R =甲基,R′=丁基(6); R,R′=丁基(7); R =甲基,R′=己基(8))合成。的单晶X射线结构2,3,和8进行了测定。热重量分析(TGA)显示出对络合物单步分解1,3,及5 - 8,和双分解步的复合物2和4和325之间195℃℃。复杂1 – 4在400°C至530°C的温度下,它们用作通过气溶胶辅助
化学气相沉积(
AACVD)沉积SnS薄膜的单源前驱体。在所有沉积温度下,从所有四个络合物沉积正交晶SnS薄膜。膜的特征在于紫外可见光谱,粉末X射线衍射(p-XRD),拉曼光谱,扫描电子显微镜(
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