申请人:——
公开号:US20020115821A1
公开(公告)日:2002-08-22
A polymer comprising recurring units of formula (1) and/or (2) wherein R
1
and R
2
are H, C
1-15
alkyl, acyl or alkylsulfonyl or C
2-15
alkoxycarbonyl or alkoxyalkyl which may have halogen substituents; R
3
and R
4
are H, C
1-15
alkyl or alkoxy or C
2-15
, alkoxyalkyl which may have halogen substituents, and R
3
and R
4
may together bond with the carbon atom to form an aliphatic ring, or R
3
and R
4
, taken together, may be an oxygen atom; and k=0 or 1, and having a Mw of 1,000-500,000 is novel. A resist composition comprising the polymer as a base resin is sensitive to high-energy radiation, has excellent sensitivity, resolution, etching resistance, and minimized swell and lends itself to micropatterning with electron beams or deep-UV.
1
一种聚合物,包含式 (1) 和/或 (2) 的递归单元,其中 R
1
和 R
2
是 H、C
1-15
烷基、酰基或烷基磺酰基或 C
2-15
烷氧基羰基或烷氧基烷基,可带有卤素取代基;R
3
和 R
4
是 H、C
1-15
烷基或烷氧基或 C
2-15
烷氧基烷基,可带有卤素取代基,以及 R
3
和 R
4
可与碳原子结合形成脂肪族环,或 R
3
和 R
4
可以是氧原子;k 等于 0 或 1,且 Mw 在 1,000-500,000 之间。由该聚合物作为基础树脂的抗蚀剂组合物对高能辐射敏感,具有优异的灵敏度、分辨率、抗蚀刻性和最小膨胀性,适合用电子束或深紫外线进行微图案化。
1