Method and apparatus for determining a quality or characteristic of connectors in electronic components is provided. Methods include applying a UV-responsive indicator solution active for Pd, Ni, or Cu to a connector on an electrical component; irradiating the connector with UV radiation; detecting a response to the UV radiation; and determining a quality of the connector based on the response to the UV radiation. Apparatus includes an enclosure; a support; a dispenser oriented toward the substrate support; a source of UV-responsive indicator solution active for Pd, Ni, or Cu ions fluidly coupled to the dispenser; a UV source coupled to the enclosure; and a radiation sensor positioned to detect light inside the enclosure.
提供了用于确定电子元件连接器质量或特性的方法和装置。方法包括:将对
钯、
镍或
铜有活性的紫外线反应指示溶液应用于电子元件上的连接器;用紫外线辐射照射连接器;检测对紫外线辐射的响应;以及根据对紫外线辐射的响应确定连接器的质量。仪器包括一个外壳;一个支撑物;一个朝向基板支撑物的分配器;一个与分配器流体耦合的对
钯、
镍或
铜离子有活性的紫外线反应指示溶液源;一个与外壳耦合的紫外线源;以及一个定位以检测外壳内光线的辐射传感器。