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1,5-bis-(1-hydroxy-ethyl)-naphthalene | 33929-65-6

中文名称
——
中文别名
——
英文名称
1,5-bis-(1-hydroxy-ethyl)-naphthalene
英文别名
1,5-Bis-(1-hydroxy-aethyl)-naphthalin;1-[5-(1-Hydroxyethyl)naphthalen-1-yl]ethanol
1,5-bis-(1-hydroxy-ethyl)-naphthalene化学式
CAS
33929-65-6
化学式
C14H16O2
mdl
——
分子量
216.28
InChiKey
GWXHWIDHAATXBD-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

物化性质

  • 沸点:
    397.7±22.0 °C(Predicted)
  • 密度:
    1.164±0.06 g/cm3(Predicted)

计算性质

  • 辛醇/水分配系数(LogP):
    2.2
  • 重原子数:
    16
  • 可旋转键数:
    2
  • 环数:
    2.0
  • sp3杂化的碳原子比例:
    0.29
  • 拓扑面积:
    40.5
  • 氢给体数:
    2
  • 氢受体数:
    2

上下游信息

  • 上游原料
    中文名称 英文名称 CAS号 化学式 分子量
  • 下游产品
    中文名称 英文名称 CAS号 化学式 分子量

反应信息

点击查看最新优质反应信息

文献信息

  • Actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, mask blank including actinic ray-sensitive or radiation-sensitive film, pattern forming method, and method for manufacturing electronic device
    申请人:FUJIFILM Corporation
    公开号:US10545405B2
    公开(公告)日:2020-01-28
    Provided are an actinic ray-sensitive or radiation-sensitive resin composition including a compound (A) whose dissolution rate in an alkali developer decreases by the action of an acid, a resin (B) having a group that decomposes by the action of an alkali developer to increase the solubility in the alkali developer and having at least one of a fluorine atom or a silicon atom, and a resin (C) having a phenolic hydroxyl group, different from the resin (B), an actinic ray-sensitive or radiation-sensitive film and a mask blank, each formed using the actinic ray-sensitive or radiation-sensitive resin composition, a pattern forming method using the actinic ray-sensitive or radiation-sensitive resin composition, and a method for manufacturing an electronic device.
    本发明提供了一种感光性或辐射敏感性树脂组合物,包括在酸的作用下在碱显影剂中的溶解度降低的化合物 (A)、具有在碱显影剂中分解以增加在碱显影剂中的溶解度的基团且至少具有一个原子或原子的树脂 (B) 以及具有与树脂 (B) 不同的羟基的树脂 (C)、使用感光性或辐射敏感性胶片和掩膜坯形成的感光性或辐射敏感性胶片和掩膜坯、和一种具有不同于树脂(B)的羟基的树脂(C),一种感光胶片或感光胶片和一种掩膜坯,它们分别使用感光胶片或感光胶片树脂组合物形成,一种使用感光胶片或感光胶片树脂组合物的图案形成方法,以及一种制造电子设备的方法。
  • ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE
    申请人:FUJIFILM Corporation
    公开号:US20170351176A1
    公开(公告)日:2017-12-07
    Provided are an actinic ray-sensitive or radiation-sensitive resin composition including a compound (A) whose dissolution rate in an alkali developer decreases by the action of an acid, a resin (B) having a group that decomposes by the action of an alkali developer to increase the solubility in the alkali developer and having at least one of a fluorine atom or a silicon atom, and a resin (C) having a phenolic hydroxyl group, different from the resin (B), an actinic ray-sensitive or radiation-sensitive film and a mask blank, each formed using the actinic ray-sensitive or radiation-sensitive resin composition, a pattern forming method using the actinic ray-sensitive or radiation-sensitive resin composition, and a method for manufacturing an electronic device.
  • PRE-RINSING LIQUID, PRE-RINSING TREATMENT METHOD, AND PATTERN FORMING METHOD
    申请人:FUJIFILM Corporation
    公开号:US20180087010A1
    公开(公告)日:2018-03-29
    Provided is a pre-rinsing liquid used in a method including forming a resist film including an actinic ray-sensitive or radiation-sensitive composition on a substrate, and irradiating the resist film with actinic rays or radiation to form a pattern on the substrate, and used for subjecting the substrate to a pre-rinsing treatment before applying the actinic ray-sensitive or radiation-sensitive composition onto the substrate. The pre-rinsing liquid satisfies the following conditions (1) and (2): (1) the pre-rinsing liquid includes 80% by mass or more of an organic solvent with respect to the total mass of the pre-rinsing liquid, and (2) the organic solvent is at least one organic solvent selected from the group consisting of alcohols, cyclic ethers, glycol ethers, glycol ether acetates, hydrocarbons, ketones, lactones, and esters.
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