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[2-[(2-methylpropan-2-yl)oxy]-2-oxoethyl] (4R)-4-[(3R,5R,8R,9S,10S,12S,13R,14S,17R)-3,12-dihydroxy-10,13-dimethyl-2,3,4,5,6,7,8,9,11,12,14,15,16,17-tetradecahydro-1H-cyclopenta[a]phenanthren-17-yl]pentanoate | 231296-44-9

中文名称
——
中文别名
——
英文名称
[2-[(2-methylpropan-2-yl)oxy]-2-oxoethyl] (4R)-4-[(3R,5R,8R,9S,10S,12S,13R,14S,17R)-3,12-dihydroxy-10,13-dimethyl-2,3,4,5,6,7,8,9,11,12,14,15,16,17-tetradecahydro-1H-cyclopenta[a]phenanthren-17-yl]pentanoate
英文别名
——
[2-[(2-methylpropan-2-yl)oxy]-2-oxoethyl] (4R)-4-[(3R,5R,8R,9S,10S,12S,13R,14S,17R)-3,12-dihydroxy-10,13-dimethyl-2,3,4,5,6,7,8,9,11,12,14,15,16,17-tetradecahydro-1H-cyclopenta[a]phenanthren-17-yl]pentanoate化学式
CAS
231296-44-9
化学式
C30H50O6
mdl
——
分子量
506.7
InChiKey
RXFOPWRIPPCAHB-YGJCNJMOSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    6.2
  • 重原子数:
    36
  • 可旋转键数:
    9
  • 环数:
    4.0
  • sp3杂化的碳原子比例:
    0.93
  • 拓扑面积:
    93.1
  • 氢给体数:
    2
  • 氢受体数:
    6

文献信息

  • PHOTORESIST COMPOSITION, RESIST-PATTERN FORMING METHOD, POLYMER, AND COMPOUND
    申请人:SATO Mitsuo
    公开号:US20120258402A1
    公开(公告)日:2012-10-11
    A photoresist composition includes a polymer that includes a structural unit shown by the following formula (1), and a photoacid generator. R 1 in the formula (1) represents a hydrogen atom, a fluorine atom, a methyl group, or a trifluoromethyl group, Z represents a group that forms a divalent alicyclic group having 3 to 20 carbon atoms together with a carbon atom bonded to X, X represents an alkanediyl group having 1 to 6 carbon atoms, Y represents a hydrogen atom or —CR 2 R 3 (OR 4 ), and R 2 to R 4 independently represent a hydrogen atom or a monovalent hydrocarbon group, provided that R 3 and R 4 optionally bond to each other to form a cyclic ether structure together with a carbon atom bonded to R 3 and an oxygen atom bonded to R 4 .
    一种光阻剂组合物包括一个聚合物,该聚合物包括下式(1)所示的结构单元,以及一个光酸发生剂。在式(1)中,R1代表氢原子、氟原子、甲基基团或三氟甲基基团,Z代表与与X键合的碳原子一起形成具有3到20个碳原子的二价脂环族基团,X代表具有1到6个碳原子的脂肪二基基团,Y代表氢原子或—CR2R3(OR4),R2到R4独立地代表氢原子或一价烃基团,其中R3和R4可选择地相互键合以与与R3键合的碳原子和与R4键合的氧原子一起形成环状醚结构。
  • RADIATION SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING A PATTERN, POLYMER AND COMPOUND
    申请人:Kimoto Takakazu
    公开号:US20120276482A1
    公开(公告)日:2012-11-01
    A radiation sensitive resin composition includes a first polymer having a group represented by a following formula (1), and a radiation sensitive acid generator. n is an integer of 2 to 4. X represents a single bond or a bivalent organic group. A represents a (n+1) valent linking group. Each Q independently represents a group that includes an alkali-dissociable group.
    一种辐射敏感性树脂组合物,包括具有下式(1)所代表的基团的第一聚合物和辐射敏感性酸发生剂。n是2到4的整数。X代表单键或二价有机基团。A代表(n+1)价的连接基团。每个Q独立地代表包括可溶于碱的基团的基团。
  • RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, AND POLYMER AND COMPOUND
    申请人:Osaki Hitoshi
    公开号:US20130122426A1
    公开(公告)日:2013-05-16
    A radiation-sensitive resin composition that provides a resist coating film in a liquid immersion lithography process is provided, the radiation-sensitive resin composition being capable of exhibiting a great dynamic contact angle during exposure, whereby the surface of the resist coating film can exhibit a superior water draining property, and the radiation-sensitive resin composition being capable of leading to a significant decrease in the dynamic contact angle during development, whereby generation of development defects can be inhibited, and further shortening of a time period required for change in a dynamic contact angle is enabled. A radiation-sensitive resin composition including (A) a fluorine-containing polymer having a structural unit (I) that includes a group represented by the following formula (1), and (B) a radiation-sensitive acid generator.
    提供一种辐射敏感的树脂组合物,可在液体浸没光刻工艺中提供抗蚀涂层膜,该辐射敏感的树脂组合物能够在曝光过程中展现出极大的动态接触角,从而使抗蚀涂层膜表面表现出优越的排水性能,并且该辐射敏感的树脂组合物能够在显影过程中引起动态接触角的显著降低,从而可以抑制显影缺陷的产生,并进一步缩短动态接触角变化所需的时间。该辐射敏感的树脂组合物包括(A)一种含氟聚合物,其具有包括以下公式(1)所表示的基团的结构单元(I),以及(B)一种辐射敏感的酸发生剂。
  • RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, ORGANIC ACID AND ACID GENERATING AGENT
    申请人:MATSUDA Yasuhiko
    公开号:US20130065186A1
    公开(公告)日:2013-03-14
    A radiation-sensitive resin composition includes an acid generating agent to generate an organic acid by irradiation with a radioactive ray. The organic acid has a cyclic hydrocarbon group and an organic group including a bond that is cleavable by an acid or a base to produce a polar group. The organic acid is preferably represented by a following formula (I). Z represents an organic acid group. R 2 represents an alkanediyl group, wherein a part or all of hydrogen atoms of the alkanediyl group represented by R 1 are optionally substituted by a fluorine atom. X represents a single bond, O, OCO, COO, CO, SO 3 or SO 2 . R 2 represents a cyclic hydrocarbon group. R 3 represents a monovalent organic group having a functional group represented by a following formula (x). n is an integer of 1 to 3. Z—R 1 —X—R 2 —(R 3 ) n (I) —R 31 -G-R 13 (x)
    一种辐射敏感树脂组合物包括酸发生剂,通过放射性射线照射生成有机酸。该有机酸具有环烃基和有机基,包括可被酸或碱裂解以产生极性基团的键。有机酸最好由以下式(I)表示。其中,Z代表有机酸基团。R2代表脂肪二元基,其中R1代表脂肪二元基中的一部分或全部氢原子可选地被氟原子取代。X代表单键,O,OCO,COO,CO,SO3或SO2。R2代表环烃基。R3代表具有以下式(x)所表示的官能团的一价有机基。n为1到3的整数。Z-R1-X-R2-(R3)n(I)-R31-G-R13(x)。
  • Acid generator, sulfonic acid, sulfonic acid derivatives and radiation-sensitive resin composition
    申请人:——
    公开号:US20030113658A1
    公开(公告)日:2003-06-19
    A novel photoacid generator containing a structure of the following formula (I), 1 wherein R is a monovalent organic group with a fluorine content of 50 wt % or less, a nitro group, a cyano group, or a hydrogen atom, and Z 1 and Z 2 are individually a fluorine atom or a linear or branched perfluoroalkyl group having 1-10 carbon atoms, is provided. When used in a chemically amplified radiation-sensitive resin composition, the photoacid generator exhibits high transparency, comparatively high combustibility, and no bioaccumulation, and produces an acid exhibiting high acidity, high boiling point, moderately short diffusion length in the resist coating, and low dependency to mask pattern density.
    提供一种新型光酸发生剂,其含有以下式(I)的结构,其中R是一种具有50重量%或以下氟含量,硝基,氰基或氢原子的一价有机基团,Z1和Z2分别是氟原子或具有1-10个碳原子的线性或支链全氟烷基团。当用于化学增感辐射敏感树脂组成物中时,该光酸发生剂表现出高透明度,相对高的可燃性和无生物积累,并产生具有高酸度,高沸点,适度短的扩散长度在抗蚀涂层中,并且对掩模图案密度的依赖性低的酸。
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