A molecular sieve material, EMM-17, has in its as-calcined form an X-ray diffraction pattern including the following peaks in Table 11:
TABLE 11
d-spacing
Relative Intensity
(Å)
[100 × I/I(o)] %
17.4-16.4
1-10
12.6-12.1
1-20
11.8-11.4
60-100
11.2-10.8
5-30
10.7-10.3
30-80
8.62-8.38
10-40
6.09-5.96
1-20
5.71-5.61
1-20
4.23-4.17
1-20
4.09-4.03
1-10
3.952-3.901
10-40
3.857-3.809
5-30
3.751-3.705
1-20
3.727-3.682
1-20
3.689-3.644
1-10
3.547-3.506
1-20
一种
分子筛材料EMM-17,在其煅烧形态下,具有以下峰值的X射线衍射图案,表11如下:
表11
d-间距(Å) 相对强度([100 × I/I(o)] %)
17.4-16.41 1-10
12.6-12.11 20-11
11.8-11.46 0-100
11.2-10.85 3-10
10.7-10.33 0-80
8.62-8.38 10-40
6.09-5.96 1-20
5.71-5.61 1-20
4.23-4.17 1-20
4.09-4.03 1-10
3.952-3.901 10-40
3.857-3.8095 30-75
3.751-3.7051 20-51
3.727-3.6821 20-36
3.689-3.6441 10-35
3.547-3.5061 20-