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6-(Dicyclohexylamino)-1,3,5-triazine-2,4(1H,3H)-dithione | 51105-02-3

中文名称
——
中文别名
——
英文名称
6-(Dicyclohexylamino)-1,3,5-triazine-2,4(1H,3H)-dithione
英文别名
6-(dicyclohexylamino)-1H-1,3,5-triazine-2,4-dithione
6-(Dicyclohexylamino)-1,3,5-triazine-2,4(1H,3H)-dithione化学式
CAS
51105-02-3
化学式
C15H24N4S2
mdl
——
分子量
324.5
InChiKey
QEQSXQYJJLHQHU-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    3.9
  • 重原子数:
    21
  • 可旋转键数:
    3
  • 环数:
    3.0
  • sp3杂化的碳原子比例:
    0.8
  • 拓扑面积:
    104
  • 氢给体数:
    2
  • 氢受体数:
    2

文献信息

  • ANTIREFLECTIVE FILM CONTAINING SULFUR ATOM
    申请人:Nissan Chemical Industries, Ltd.
    公开号:EP1757985A1
    公开(公告)日:2007-02-28
    There is provided an anti-reflective coating forming composition comprising a solid content and a solvent, wherein a proportion of sulfur atom in the solid content is 5 to 25 mass%. The anti-reflective coating obtained from the composition has a high preventive effect for reflected light, causes no intermixing with photoresists, and can use in lithography process by use of a light having a short wavelength such as F2 excimer laser beam (wavelength 157 nm) or ArF excimer laser beam (wavelength 193 nm), etc.
    本发明提供了一种抗反射涂层形成组合物,该组合物由固体成分和溶剂组成,其中固体成分中原子的比例为 5 至 25 质量%。由该组合物制得的防反射涂层对反射光有很好的防止效果,不会与光刻胶混合,并且可以在光刻工艺中使用短波长的光,如 F2 准分子激光束(波长 157 nm)或 ArF 准分子激光束(波长 193 nm)等。
  • Thiol compound derivative, hardening compositions containing these derivatives and molded articles thereof
    申请人:——
    公开号:US20040162368A1
    公开(公告)日:2004-08-19
    The present invention relates to a thiol compound derivative represented by the following formula (1), a curable composition containing the derivative, and a molded product made of the composition. More particularly, the invention relates to a thiol compound derivative which is added to a polymer having reactivity to a thiol derivative substituent to provide a curable composition, a curable composition containing the derivative and a crosslinkable halogen-containing crosslinking polymer, and a crosslinked molded product of the composition. 1 wherein X 1 , X 2 and X 3 are each a group represented by the following formula (2). 2
    本发明涉及由下式(1)表示的醇化合物衍生物、含有该衍生物的可固化组合物以及由该组合物制成的模塑产品。更具体地说,本发明涉及一种醇化合物衍生物,将其添加到对醇衍生物取代基具有反应活性的聚合物中,以提供一种可固化组合物、一种含有该衍生物和一种可交联含卤交联聚合物的可固化组合物,以及一种由该组合物制成的交联模塑产品。 1 其中 X 1 , X 2 和 X 3 分别是下式(2)所代表的一个基团。 2
  • THIOL COMPOUND DERIVATIVES, HARDENING COMPOSITIONS CONTAINING THESE DERIVATIVES AND MOLDED ARTICLES THEREOF
    申请人:Unimatec Co., Ltd.
    公开号:EP1394153B1
    公开(公告)日:2010-12-29
  • Thiol compound derivative, curable composition containing the derivative, and molded product thereof
    申请人:Endo Kiyoshi
    公开号:US20070155868A1
    公开(公告)日:2007-07-05
    The present invention relates to a thiol compound derivative represented by the following formula (1), a curable composition containing the derivative, and a molded product made of the composition. More particularly, the invention relates to a thiol compound derivative which is added to a polymer having reactivity to a thiol derivative substituent to provide a curable composition, a curable composition containing the derivative and a crosslinkable halogen-containing crosslinking polymer, and a crosslinked molded product of the composition. wherein X 1 , X 2 and X 3 are each a group represented by the following formula (2).
  • Anti-Reflective Coating Containing Sulfur Atom
    申请人:Hiroi Yoshiomi
    公开号:US20080107997A1
    公开(公告)日:2008-05-08
    There is provided an anti-reflective coating forming composition comprising a solid content and a solvent, wherein a proportion of sulfur atom in the solid content is 5 to 25 mass %. The anti-reflective coating obtained from the composition has a high preventive effect for reflected light, causes no intermixing with photoresists, and can use in lithography process by use of a light having a short wavelength such as F2 excimer laser beam (wavelength 157 nm) or ArF excimer laser beam (wavelength 193 nm), etc.
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