[EN] COMPOSITIONS AND METHODS FOR SELECTIVE POLISHING OF PLATINUM AND RUTHENIUM MATERIALS<br/>[FR] COMPOSITIONS ET PROCÉDÉS POUR POLISSAGE SÉLECTIF DE MATÉRIAUX DE PLATINE ET DE RUTHÉNIUM
申请人:CABOT MICROELECTRONICS CORP
公开号:WO2014031427A1
公开(公告)日:2014-02-27
The present invention provides chemical-mechanical polishing (CMP) methods for polishing a platinum and/or ruthenium containing substrate, and compositions suitable for use in the methods. The polishing compositions used with the methods of the invention, which contain alumina and at least one additive selected from the group consisting of a suppressor, a complexing agent, and an amino compound, allow for platinum and ruthenium to be polished. The methods of the invention provide for tailoring the relative removal rates of platinum, ruthenium, silicon oxide and silicon nitride.