申请人:The Regents of the University of California
公开号:US07042755B1
公开(公告)日:2006-05-09
This invention provides novel high density memory devices (FIG. 3) that are electrically addressable permitting effective reading and writing, that provide a high memory density (102), that provide a high degree of fault tolerance, and that are amenable to efficient chemical synthesis and chip fabrication. The devices arc intrinsically latchable, defect tolerant, and support destructive or non-destructive read cycles. In a preferred embodiment, the device comprises a fixed electrode electrically coupled to a storage medium having a multiplicity of different and distinguishable oxidation states wherein data is stored in said oxidation states by the addition or withdrawal of one or more electrons from said storage medium via the electrically coupled electrode.
本发明提供了一种新型高密度存储器件(图3),可进行电子寻址,以实现有效的读写,提供高密度存储(102),具有高度的容错性,并且适用于高效的化学合成和芯片制造。该设备本质上是可锁存的,具有缺陷容忍能力,并支持破坏性或非破坏性读取周期。在首选实施例中,该设备包括与一个存储介质电性耦合的固定电极,该存储介质具有多种不同的可区分的氧化态,其中通过向存储介质中加入或撤回一个或多个电子来将数据存储在该氧化态中。