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2-[(2-Carboxycyclohexyl)methoxy]ethyl-trimethylazanium

中文名称
——
中文别名
——
英文名称
2-[(2-Carboxycyclohexyl)methoxy]ethyl-trimethylazanium
英文别名
2-[(2-carboxycyclohexyl)methoxy]ethyl-trimethylazanium
2-[(2-Carboxycyclohexyl)methoxy]ethyl-trimethylazanium化学式
CAS
——
化学式
C13H26NO3+
mdl
——
分子量
244.35
InChiKey
HVBJZXUERHHAML-UHFFFAOYSA-O
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    1.5
  • 重原子数:
    17
  • 可旋转键数:
    6
  • 环数:
    1.0
  • sp3杂化的碳原子比例:
    0.92
  • 拓扑面积:
    46.5
  • 氢给体数:
    1
  • 氢受体数:
    3

文献信息

  • PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, METHOD OF MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
    申请人:FUJIFILM CORPORATION
    公开号:US20150378257A1
    公开(公告)日:2015-12-31
    According to one example of the present application, there is provided a pattern forming method including: (i) forming a film by using an actinic ray-sensitive or radiation-sensitive resin composition containing (A) a specific resin and (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation; (ii) exposing the film; and (iii) developing the film exposed, by using an organic solvent-containing developer to form a negative pattern.
  • METHOD OF FORMING PATTERN, ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC-RAY- OR RADIATION-SENSITIVE FILM, PROCESS FOR MANUFACTURING ELECTRONIC DEVICE AND ELECTRONIC DEVICE
    申请人:FUJIFILM CORPORATION
    公开号:US20160004157A1
    公开(公告)日:2016-01-07
    A method of forming a pattern includes (a) forming a film of an actinic-ray- or radiation-sensitive resin composition, (b) exposing the film to light, and (c) developing the exposed film with a developer comprising an organic solvent to thereby form a negative pattern. The actinic-ray- or radiation-sensitive resin composition includes (A) a resin whose solubility in the developer comprising an organic solvent is lowered when acted on by an acid, which resin contains a repeating unit with any of lactone structures of general formula (1) below, and (B) a compound that when exposed to actinic rays or radiation, generates an acid.
  • METHOD FOR MANUFACTURING ORGANIC PROCESSING FLUID FOR PATTERNING OF CHEMICAL AMPLIFICATION TYPE RESIST FILM, ORGANIC PROCESSING FLUID FOR PATTERNING OF CHEMICAL AMPLIFICATION TYPE RESIST FILM, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
    申请人:FUJIFILM Corporation
    公开号:US20160026088A1
    公开(公告)日:2016-01-28
    There is disclosed a method for manufacturing an organic processing fluid for patterning of a chemical amplification type resist film, comprising a step of causing a fluid containing an organic solvent to pass through a filtration device having a fluid input portion, a fluid output portion, and a filtration filter film provided in a flow path that connects the fluid input portion and the fluid output portion with each other, wherein an absolute value (|T I −T o |) of a difference between a temperature (T I ) of the fluid in the fluid input portion and a temperature (T o ) of the fluid in the fluid output portion is 3° C. or lower, a filtration speed of the fluid in the filtration device is 0.5 L/min/m 2 or greater, and a filtration pressure by the fluid in the filtration device is 0.10 MPa or lower.
  • PATTERN FORMING METHOD, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
    申请人:FUJIFILM CORPORATION
    公开号:US20160070174A1
    公开(公告)日:2016-03-10
    Disclosed is a pattern forming method including forming an active light sensitive or radiation sensitive film by coating a substrate with an active light sensitive or radiation sensitive resin composition; exposing the active light sensitive or radiation sensitive film; and forming a negative type pattern by developing the exposed active light sensitive or radiation sensitive film using a developer which includes an organic solvent, in which the active light sensitive or radiation sensitive resin composition contains a resin (A) which includes a repeating unit (a) which has an acidic group and a lactone structure and of which, due to a polarity thereof being increased by an action of an acid, a solubility decreases with respect to a developer which includes an organic solvent.
  • US9235117B2
    申请人:——
    公开号:US9235117B2
    公开(公告)日:2016-01-12
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同类化合物

(乙腈)二氯镍(II) (R)-(-)-α-甲基组胺二氢溴化物 (N-(2-甲基丙-2-烯-1-基)乙烷-1,2-二胺) (4-(苄氧基)-2-(哌啶-1-基)吡啶咪丁-5-基)硼酸 (11-巯基十一烷基)-,,-三甲基溴化铵 鼠立死 鹿花菌素 鲸蜡醇硫酸酯DEA盐 鲸蜡硬脂基二甲基氯化铵 鲸蜡基胺氢氟酸盐 鲸蜡基二甲胺盐酸盐 高苯丙氨醇 高箱鲀毒素 高氯酸5-(二甲氨基)-1-({(E)-[4-(二甲氨基)苯基]甲亚基}氨基)-2-甲基吡啶正离子 高氯酸2-氯-1-({(E)-[4-(二甲氨基)苯基]甲亚基}氨基)-6-甲基吡啶正离子 高氯酸2-(丙烯酰基氧基)-N,N,N-三甲基乙铵 马诺地尔 马来酸氢十八烷酯 马来酸噻吗洛尔EP杂质C 马来酸噻吗洛尔 马来酸倍他司汀 顺式环己烷-1,3-二胺盐酸盐 顺式氯化锆二乙腈 顺式吡咯烷-3,4-二醇盐酸盐 顺式双(3-甲氧基丙腈)二氯铂(II) 顺式3,4-二氟吡咯烷盐酸盐 顺式1-甲基环丙烷1,2-二腈 顺式-二氯-反式-二乙酸-氨-环己胺合铂 顺式-二抗坏血酸(外消旋-1,2-二氨基环己烷)铂(II)水合物 顺式-N,2-二甲基环己胺 顺式-4-甲氧基-环己胺盐酸盐 顺式-4-环己烯-1.2-二胺 顺式-4-氨基-2,2,2-三氟乙酸环己酯 顺式-3-氨基环丁烷甲腈盐酸盐 顺式-2-羟基甲基-1-甲基-1-环己胺 顺式-2-甲基环己胺 顺式-2-(苯基氨基)环己醇 顺式-2-(苯基氨基)环己醇 顺式-2-(氨基甲基)-1-苯基环丙烷羧酸盐酸盐 顺式-1,3-二氨基环戊烷 顺式-1,2-环戊烷二胺二盐酸盐 顺式-1,2-环戊烷二胺 顺式-1,2-环丁腈 顺式-1,2-双氨甲基环己烷 顺式--N,N'-二甲基-1,2-环己二胺 顺式-(R,S)-1,2-二氨基环己烷铂硫酸盐 顺式-(2-氨基-环戊基)-甲醇 顺-2-戊烯腈 顺-1,3-环己烷二胺 顺-1,3-双(氨甲基)环己烷