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4-methyl-naphthalene-1,6-diol | 860252-40-0

中文名称
——
中文别名
——
英文名称
4-methyl-naphthalene-1,6-diol
英文别名
4-Methyl-naphthalin-1,6-diol;4-Methylnaphthalene-1,6-diol
4-methyl-naphthalene-1,6-diol化学式
CAS
860252-40-0
化学式
C11H10O2
mdl
——
分子量
174.199
InChiKey
BMGNFMQRCUTKBD-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

计算性质

  • 辛醇/水分配系数(LogP):
    2.8
  • 重原子数:
    13
  • 可旋转键数:
    0
  • 环数:
    2.0
  • sp3杂化的碳原子比例:
    0.09
  • 拓扑面积:
    40.5
  • 氢给体数:
    2
  • 氢受体数:
    2

反应信息

点击查看最新优质反应信息

文献信息

  • COMPOSITION FOR FORMING ORGANIC FILM, SUBSTRATE FOR MANUFACTURING SEMICONDUCTOR DEVICE, METHOD FOR FORMING ORGANIC FILM, AND PATTERNING PROCESS
    申请人:Shin-Etsu Chemical Co., Ltd.
    公开号:EP3508918A1
    公开(公告)日:2019-07-10
    The invention provides: a composition for forming an organic film, the composition having high filterability and enabling formation of an organic film which has high pattern-curving resistance, and which prevents a high-aspect line pattern particularly finer than 40 nm from line collapse and twisting after dry etching; a method for forming an organic film and a patterning process which use the composition; and a substrate for manufacturing a semiconductor device, including the organic film formed on the substrate. The composition for forming an organic film includes a condensate (A), which is a condensation product of dihydroxynaphthalene shown by the following formula (1) and a condensation agent, or a derivative of the condensate (A). A sulfur content among constituent elements contained in the condensate (A) or the derivative of the condensate (A) is 100 ppm or less in terms of mass.
    本发明提供了:一种用于形成有机薄膜的组合物,该组合物具有高过滤性,能够形成具有高图案抗弯曲性的有机薄膜,并且在干法蚀刻后能够防止特别细于40纳米的高光谱线图案发生线崩溃和扭曲;一种使用该组合物的形成有机薄膜的方法和图案化工艺;以及一种用于制造半导体器件的基板,包括在该基板上形成的有机薄膜。用于形成有机薄膜的组合物包括缩合物(A),它是下式(1)所示的二羟基萘和缩合剂的缩合产物,或缩合物(A)的衍生物。冷凝液(A)或冷凝液(A)的衍生物所含成分元素中的硫含量按质量计算不超过 100 ppm。
  • Compound for forming organic film, and organic film composition using the same, process for forming organic film, and patterning process
    申请人:SHIN-ETSU CHEMICAL CO., LTD.
    公开号:US10007183B2
    公开(公告)日:2018-06-26
    The invention provides a compound for forming an organic film having a partial structure represented by the following formula (ii), wherein the ring structures Ar1, Ar2 and Ar3 each represent a substituted or unsubstituted benzene ring or naphthalene ring; e is 0 or 1; R0 represents a hydrogen atom or a linear, branched or cyclic monovalent organic group having 1 to 30 carbon atoms; L0 represents a linear, branched or cyclic divalent organic group having 1 to 32 carbon atoms; and the methylene group constituting L0 may be substituted by an oxygen atom or a carbonyl group. There can be provided an organic film composition for forming an organic film having high dry etching resistance as well as advanced filling/planarizing characteristics.
    本发明提供了一种用于形成有机薄膜的化合物,其部分结构由下式(ii)表示、 其中,环结构 Ar1、Ar2 和 Ar3 分别代表取代或未取代的苯环或萘环;e 为 0 或 1;R0 代表氢原子或具有 1 至 30 个碳原子的线性、支链或环状一价有机基团;L0 代表具有 1 至 32 个碳原子的线性、支链或环状二价有机基团;构成 L0 的亚甲基可被氧原子或羰基取代。本发明可提供一种有机薄膜组合物,用于形成具有高抗干蚀刻性和高级填充/平面化特性的有机薄膜。
  • Composition for forming organic film, substrate for manufacturing semiconductor device, method for forming organic film, and patterning process
    申请人:SHIN-ETSU CHEMICAL CO., LTD.
    公开号:US11018015B2
    公开(公告)日:2021-05-25
    The invention provides: a composition for forming an organic film, the composition having high filterability and enabling formation of an organic film which has high pattern-curving resistance, and which prevents a high-aspect line pattern particularly finer than 40 nm from line collapse and twisting after dry etching; a method for forming an organic film and a patterning process which use the composition; and a substrate for manufacturing a semiconductor device, including the organic film formed on the substrate. The composition for forming an organic film includes a condensate (A), which is a condensation product of dihydroxynaphthalene shown by the following formula (1) and a condensation agent, or a derivative of the condensate (A). A sulfur content among constituent elements contained in the condensate (A) or the derivative of the condensate (A) is 100 ppm or less in terms of mass.
    本发明提供了:一种用于形成有机薄膜的组合物,该组合物具有高过滤性,能够形成具有高图案抗弯曲性的有机薄膜,并且在干法蚀刻后能够防止特别细于40纳米的高光谱线图案发生线崩溃和扭曲;一种使用该组合物的形成有机薄膜的方法和图案化工艺;以及一种用于制造半导体器件的基板,包括在该基板上形成的有机薄膜。用于形成有机薄膜的组合物包括缩合物(A),它是下式(1)所示的二羟基萘和缩合剂的缩合产物,或缩合物(A)的衍生物。冷凝液(A)或冷凝液(A)的衍生物所含成分元素中的硫含量按质量计算不超过 100 ppm。
  • Preparation of organic polymers
    申请人:RAYCHEM LIMITED
    公开号:EP0154506B1
    公开(公告)日:1992-02-05
  • COMPOUND FOR FORMING ORGANIC FILM, AND ORGANIC FILM COMPOSITION USING THE SAME, PROCESS FOR FORMING ORGANIC FILM, AND PATTERNING PROCESS
    申请人:SHIN-ETSU CHEMICAL CO., LTD.
    公开号:US20160018735A1
    公开(公告)日:2016-01-21
    The invention provides a compound for forming an organic film having a partial structure represented by the following formula (vii-2), wherein R 1 represents a linear, branched or cyclic monovalent hydrocarbon group having 1 to 20 carbon atoms, and a methylene group constituting R 1 may be substituted by an oxygen atom; a+b is 1, 2 or 3; c and d are each independently 0, 1 or 2; x represents 0 or 1, when x=0, then a=c=0; L 7 represents a linear, branched or cyclic divalent organic group having 1 to 20 carbon atoms, L 8′ represents the partial structure represented by the following formula (i), 0≦o<1, 0
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