[Problem] To reduce the time required for a film to exhibit decreased hydrophobicity after liquid immersion lithography while allowing the surface of a film to exhibit high hydrophobicity during liquid immersion lithography.
[Solution] A radiation-sensitive resin composition including (A) a polymer that includes a repeating unit (a1) and a fluorine atom, and (B) a photoacid generator, the repeating unit (a1) including a group shown by any of the following formulas (1-1) to (1-3).
[问题] 在液体浸润光刻后,减少薄膜表现出降低的疏
水性所需的时间,同时允许薄膜表面在液体浸润光刻期间表现出高疏
水性。[解决方案] 包括(A)聚合物和(B)光酸发生剂的辐射敏感
树脂组合物,其中重复单元(a1)包括重复单元(a1)和
氟原子,并且(a1)包括以下任意一种公式(1-1)至(1-3)所示的基团。