Optical characterization of amine-solution-processed amorphous <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si1.gif" overflow="scroll"><mml:mrow><mml:msub><mml:mrow><mml:mtext>AsS</mml:mtext></mml:mrow><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math> chalcogenide thin films by the use of transmission spectroscopy
作者:E. Márquez、J.M. Díaz、C. García-Vázquez、E. Blanco、J.J. Ruiz-Pérez、D.A. Minkov、G.V. Angelov、G.M. Gavrilov
DOI:10.1016/j.jallcom.2017.05.303
日期:2017.10
Amorphous thin layers with non-stoichiometric chemical composition AS33$67 (AsS2) have been prepared by spin coating. This particular deposition technique is a very promising, low-cost technique, to create optical-grade, chalcogenide glass thin films, which are certainly ideal for visible and infrared applications. The layer thickness and optical constants have been first determined by the Swanepoel transmittance-envelope method, for the case of uniform thin films, with an accuracy better than 1%. The refractive-index dispersion has been analyzed on the basis of the Wemple-DiDomenico single-effective oscillator model: n(2)(E) = 1 + EoEd/(E-0(2)- E-2), where E-0 is the single-oscillator energy and Ed the dispersion energy. The strong-absorption region of the absorption edge is described using the 'non-direct electronic transition' model, proposed by Tauc. Structural information of the AsS2 bulk and thin-layer samples has been gained from X-ray diffraction measurements, and, also, from the analysis of the refractive-index dispersion. In addition, the simulation software WVASE32 was successfully utilized in fitting the experimental, normal-incidence transmission data by the use of Tauc-Lorentz model; an excellent fit between the measured and software-generated optical transmission spectra has been generally achieved, with a mean-squared-error as low as around 0.4. (C) 2017 Elsevier B.V. All rights reserved.