Resist composition, method for forming resist pattern, compound, and acid generator
申请人:TOKYO OHKA KOGYO CO., LTD.
公开号:US10394122B2
公开(公告)日:2019-08-27
A resist composition which generates an acid upon exposure and changes a solubility in a developing solution under an action of the acid, the resist composition containing a base material component whose solubility in the developing solution changes under the action of an acid and an acid generator represented by general formula (b1). In general formula (b-1), Rb1 represents an aromatic hydrocarbon group having at least one alkyl group having 3 or more carbon atoms as a substituent, Yb1 represents a divalent linking group containing an ester bond (—C(═O)—O— or —O—C(═O)—), Vb1 represents an alkylene group, a fluorinated alkylene group, or a single bond, m is an integer of 1 or more, and Mm+ represents an m-valent organic cation.
Rb1—Yb1—Vb1—CF2—SO3−(Mm+)1/m (b1)
一种抗蚀剂组合物,该抗蚀剂组合物在曝光时产生酸,并在酸的作用下改变在显影液中的溶解度,该抗蚀剂组合物含有在酸的作用下其在显影液中的溶解度会发生变化的碱基材料成分和通式(b1)表示的酸发生器。在通式(b-1)中,Rb1 代表芳香烃基团,其取代基至少有一个具有 3 个或更多碳原子的烷基,Yb1 代表含有酯键(-C(═O)-O-或-O-C(═O)-)的二价连接基团,Vb1 代表亚烷基、氟化亚烷基或单键,m 是 1 或更多的整数,Mm+ 代表 m 价有机阳离子。
Rb1-Yb1-Vb1-CF2-SO3-(Mm+)1/m (b1)