Methods, systems and apparatuses for testing and calibrating fluorescent scanners
申请人:Affymetrix, Inc.
公开号:US10422750B2
公开(公告)日:2019-09-24
Disclosed are calibration apparatuses for fluorescent microscopy instruments and methods of making and using them. Specifically, disclosed are calibration apparatuses with a fluorescent layer, such as photoresist, deposited on a substrate, with an optional layer of a reflective material, such as chrome. Illumination of the fluorescent and/or reflective layers, and detection and analysis of the resulting emissions allows evaluation of the instrument with respect to both reflective and fluorescent channels. Selection of appropriate fluorescent materials for the one or more fluorescent layers allows the evaluation of an instrument with respect to different fluorophores, as would be used with an instrument capable of two color detection. Inclusion of a reflective layer further allows the evaluation and calibration of all optical channels of an instrument, including the reflective channel and two or more fluorescent channels, with a single calibration apparatus for imaging criteria such as uniformity, contrast and emission signal strength.
本发明公开了荧光显微仪器的校准装置及其制造和使用方法。具体而言,所公开的校准装置具有沉积在基板上的荧光层(如光刻胶),以及可选的反射材料层(如铬)。对荧光层和/或反射层进行照明,并对由此产生的辐射进行检测和分析,从而对仪器的反射通道和荧光通道进行评估。为一层或多层荧光层选择适当的荧光材料,可以对仪器进行不同荧光团的评估,就像对能够进行双色检测的仪器进行评估一样。加入反射层后,还可对仪器的所有光学通道(包括反射通道和两个或多个荧光通道)进行评估和校准,只需使用一个校准装置,即可达到成像标准,如均匀度、对比度和发射信号强度。