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1,1,2,2,3,3-Hexafluoro-3-(piperidin-1-ylsulfonyl)propane-1-sulfonic acid | 82727-09-1

中文名称
——
中文别名
——
英文名称
1,1,2,2,3,3-Hexafluoro-3-(piperidin-1-ylsulfonyl)propane-1-sulfonic acid
英文别名
1,1,2,2,3,3-hexafluoro-3-piperidin-1-ylsulfonylpropane-1-sulfonic acid
1,1,2,2,3,3-Hexafluoro-3-(piperidin-1-ylsulfonyl)propane-1-sulfonic acid化学式
CAS
82727-09-1
化学式
C8H11F6NO5S2
mdl
——
分子量
379.301
InChiKey
ORUULHOMQMVNMT-UHFFFAOYSA-N
BEILSTEIN
——
EINECS
——
  • 物化性质
  • 计算性质
  • ADMET
  • 安全信息
  • SDS
  • 制备方法与用途
  • 上下游信息
  • 反应信息
  • 文献信息
  • 表征谱图
  • 同类化合物
  • 相关功能分类
  • 相关结构分类

物化性质

  • 密度:
    1.74±0.1 g/cm3(Predicted)

计算性质

  • 辛醇/水分配系数(LogP):
    1.5
  • 重原子数:
    22
  • 可旋转键数:
    5
  • 环数:
    1.0
  • sp3杂化的碳原子比例:
    1.0
  • 拓扑面积:
    109
  • 氢给体数:
    1
  • 氢受体数:
    12

反应信息

点击查看最新优质反应信息

文献信息

  • Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition and resist film
    申请人:FUJIFILM CORPORATION
    公开号:US10248019B2
    公开(公告)日:2019-04-02
    A pattern forming, method, includes: (i) forming a film from an actinic ray-sensitive or radiation-sensitive resin composition that contains (A) a compound capable of generating an acid upon irradiation with an actinic ray or radiation and decomposing by an action of an acid to decrease a solubility of the compound (A) for an organic solvent; (ii) exposing the film; and (iii) performing development by using a developer containing an organic solvent.
    一种形成图案的方法包括:(i) 使用一种含有(A)一种能够在受到光或辐射照射时生成酸并通过酸的作用分解以降低该化合物(A)对有机溶剂的溶解度的光敏或辐射敏感树脂组合物形成薄膜;(ii) 曝光薄膜;和(iii) 使用含有有机溶剂的显影剂进行显影。
  • ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK PROVIDED WITH ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PHOTOMASK, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, ELECTRONIC DEVICE, COMPOUND, AND METHOD FOR PRODUCING COMPOUND
    申请人:FUJIFILM Corporation
    公开号:US20160280621A1
    公开(公告)日:2016-09-29
    The composition contains an alkali-soluble resin and a crosslinking agent that is represented by the following General Formula (I). In the formula, each of R 1 and R 6 independently represents a hydrogen atom or a hydrocarbon group having 5 or less carbon atoms; each of R 2 and R 5 independently represents an alkyl group, a cycloalkyl group, an aryl group, or an acyl group; and each of R 3 and R 4 independently represents a hydrogen atom or an organic group having 2 or more carbon atoms, and R 3 and R 4 may be bonded to each other to form a ring.
    该组合物包含一种碱溶性树脂和一种由下列通式(I)表示的交联剂。在该式中,R1和R6各自独立地表示氢原子或具有5个或更少碳原子的碳氢基团;R2和R5各自独立地表示烷基、环烷基、芳基或酰基;R3和R4各自独立地表示氢原子或具有2个或更多碳原子的有机基团,且R3和R4可以结合形成环。
  • PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION AND PATTERN FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITION
    申请人:KODAMA Kunihiko
    公开号:US20080138742A1
    公开(公告)日:2008-06-12
    The invention is related to an arylsulfonium salt compound having a polycyclic hydrocarbon structure in a cation moiety.
    本发明涉及一种在阳离子部分具有多环碳氢结构的芳基磺酸盐化合物。
  • RESIST COMPOSITION AND PATTERNING PROCESS
    申请人:Shin-Etsu Chemical Co., Ltd.
    公开号:US20200249571A1
    公开(公告)日:2020-08-06
    A resist composition comprising a sulfonium salt having formula (1) as PAG, a base polymer, and an organic solvent, when processed by lithography, has light transmittance, acid diffusion suppressing effect, and excellent lithography performance factors such as DOF, LWR and MEF. A lithography process for forming a resist pattern from the composition is also provided.
    一种抗蚀组合物,包括具有公式(1)作为PAG的磺酸盐、基础聚合物和有机溶剂。在光刻工艺中加工时,该组合物具有光透过率、抑制酸扩散效果和优异的光刻性能因素,例如DOF、LWR和MEF。还提供了一种从该组合物形成抗蚀图案的光刻工艺。
  • COMPOUND, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND PATTERN FORMATION METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE USING SAME, AND ELECTRONIC DEVICE
    申请人:FUJIFILM CORPORATION
    公开号:US20160024005A1
    公开(公告)日:2016-01-28
    There is provided an actinic ray-sensitive or radiation-sensitive resin composition containing a compound represented by the following formula (1) or (2), and the formula (1) and (2) are defined as herein, and a resist film comprising the actinic ray-sensitive or radiation-sensitive resin composition, and a pattern forming method comprising a step of exposing the resist film, and a step of developing the exposed film, and a method for manufacturing an electronic device, comprising the pattern forming method, and an electronic device manufactured by the manufacturing method of an electronic device.
    提供了一种包含下列式子(1)或(2)所代表的化合物的光致射线敏感或辐射敏感的树脂组合物,其中式(1)和(2)的定义如本文所述,以及包括该光致射线敏感或辐射敏感的树脂组合物的光阻膜,以及包括曝光光阻膜的步骤和显影曝光膜的步骤的图案形成方法,以及包括图案形成方法的制造电子装置的方法,以及由电子装置的制造方法制造的电子装置。
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