SILICON-CONTAINING FILM, FORMING MATERIAL, MAKING METHOD, AND SEMICONDUCTOR DEVICE
申请人:HAMADA Yoshitaka
公开号:US20080274627A1
公开(公告)日:2008-11-06
Using a cyclic siloxane compound having a vinyl group directly attached to a silicon atom and a relatively bulky substituent group containing a primary carbon vicinal to the silicon, a dielectric film, especially a low-k interlayer dielectric film can be formed by the plasma-enhanced CVD process.
使用一个环状环氧硅烷化合物,其中含有直接连接到硅原子的乙烯基团和相对较大的取代基团,其中包含一个与硅相邻的主要碳基团,可以通过等离子体增强的CVD过程形成介电薄膜,特别是低k层间介电薄膜。