Device arrays and methods for operation in aggressive solvents and for measurements of barrier properties of plurality of coatings
申请人:General Electric Company
公开号:US20040150827A1
公开(公告)日:2004-08-05
Methods and devices are disclosed for measuring barrier properties of a barrier coating or coating arrays where each barrier coating has a small cross section. To reduce the edge effects in the measurements of barrier properties, measurements are made using a substrate which can be flat, cylindrical or spherical structure coated with a chemically sensitive layer, a solvent resistant layer and an array of barrier coatings. The coated substrate which can be flat, cylindrical or spherical is exposed to a material of interest that has the ability to produce an analyzable variation in the chemically sensitive layer, thereby providing the ability to detect an impact of the material of interest on the barrier coatings. In one variation, an optical radiation interacts with the substrate structure, a resulting initial optical radiation associated with the initial optical radiation and each barrier coating is detected, and any impacts on the coatings by the material of interest are correlated to a value of a barrier property for each of the array of barrier coatings.
本发明公开了用于测量阻隔涂层或涂层阵列的阻隔性能的方法和装置,其中每个阻隔涂层的横截面都很小。为减少阻隔性能测量中的边缘效应,使用涂有化学敏感层、耐溶剂层和阻隔涂层阵列的基底进行测量,基底可以是平面、圆柱形或球形结构。涂有涂层的基底可以是平面、圆柱形或球形,将其暴露在相关材料中,该材料能够在化学敏感层中产生可分析的变化,从而提供检测相关材料对阻隔涂层的影响的能力。在一种变化中,光辐射与基底结构相互作用,检测与初始光辐射和每个阻隔涂层相关的初始光辐射,并将相关材料对涂层的任何影响与每个阻隔涂层阵列的阻隔特性值相关联。