Neutron diffraction study of magnetic ordering in the system NdSix (1.67 ≤ x ≤ 2.00)
作者:P. Schobinger-Papamantellos、K.H.J. Buschow、P. Fischer
DOI:10.1016/0304-8853(91)90161-3
日期:1991.6
Abstract Compounds of various compositions NdSix were studied by X-ray diffraction. The homogeneity range of orthorhombic α-GdSi2 type structure was found to extend from x ⋍ 1.75 to 1.87. By neutron diffraction we found that the Si vacancies in compounds of relatively high Si content are restricted to only one of the two crystallographic Si sites. By contrast, the Si vacancies are distributed statistically
摘要 通过 X 射线衍射研究了不同成分 NdSix 的化合物。发现正交 α-GdSi2 型结构的均匀性范围从 x ⋍ 1.75 扩展到 1.87。通过中子衍射,我们发现Si含量相对较高的化合物中的Si空位仅限于两个结晶Si位点之一。相比之下,Si 空位统计分布在 Si 含量相对较低的化合物中的两个 Si 位点上。在狭窄的均匀性范围内,磁性排序的类型也发生了巨大的变化。对于高 Si 浓度,具有波矢量 [ 1 2 , 0, 0] 和 [0, 1 2 , 0] 的反铁磁排序引起作为温度函数的若干相变,包括其中两个以上相互作用的不相称区域可以观察到波矢量。