申请人:KABUSHIKI KAISHA TOSHIBA
公开号:EP0120981A1
公开(公告)日:1984-10-10
There is disclosed a highly reliable resin encapsulation type semiconductor device excellent humidity resistance as well as high temperature electric characteristics. The specific feature consists in the epoxy resin composition employed for encapsulation. This composition comprises a novolac type epoxy resin, a novolac type phenol resin, an organic phosphine compound and an organic phosphorus acid compound.
The resin encapsulation type semiconductor device is markedly small in leak current under hot an humid conditions and has a prolonged life due to difficult deterioration through corrosion of electrodes and aluminum wiring, as compared with those of prior art.
本发明公开了一种高度可靠的树脂封装型半导体器件,具有优异的耐湿性和高温电特性。其具体特点在于封装所使用的环氧树脂组合物。这种组合物由酚醛型环氧树脂、酚醛型苯酚树脂、有机膦化合物和有机磷酸化合物组成。
与现有技术相比,这种树脂封装型半导体器件在湿热条件下的泄漏电流明显较小,并且由于电极和铝线不易腐蚀而延长了使用寿命。