| 807261-54-7

• CAS: 807261-54-7
• 化学式: ClF
• 分子量: 54.4514
• InChiKey: LDLDQLAJXGYORN-UHFFFAOYSA-N

计算性质

• 辛醇/水分配系数(LogP)：
  None
• 重原子数：
  None
• 可旋转键数：
  None
• 环数：
  None
• sp3杂化的碳原子比例：
  None
• 拓扑面积：
  None
• 氢给体数：
  None
• 氢受体数：
  None

反应信息

• 作为产物：
  描述：

  硫氯五氟化物 以 neat (no solvent, gas phase) 为溶剂， 生成 盐酸 、 sulfurpentafluoride 、
  参考文献：
  名称：

  Doren, Jane M. Van; Miller, Thomas M.; Viggiano, Albert A., Journal of Chemical Physics, p. 1 - 8

  摘要：

  DOI：

文献信息

• Associative and dissociative electron attachment by SF₆and SF₅Cl
  作者：Marita Fenzlaff、Rolf Gerhard、Eugen Illenberger

  DOI：10.1063/1.454646

  日期：1988.1

  Electron attachment by SF6 and SF5Cl in the energy range 0–20 eV has been studied in a beam experiment at room temperature. At low energies (≊0 eV) electron attachment to SF6 yields the well known parent anion SF−*6 (associative attachment) and SF−5 (dissociative attachment), while other negative ion fragments (F−, F−2 , SF−2 , SF−3 , and SF−4) are generated with comparably low cross sections from various resonances at higher energies. In contrast to that, negative ion formation in SF5Cl is dominated by dissociative channels (F−, Cl−, FCl−, and SF−5 ) and only a weak SF5Cl− signal is observed. A time-of-flight analysis of the ionic fragments reveals that the decomposition of all resonances is characterized by a low translational excess energy release indicating effective energy randomization in the parent ion prior to dissociation. The present results are compared with negative ion formation in halogenated hydrocarbons.