(1,2-bis(di(4-methoxyphenyl)phosphino)ethane)platinum(II)dichloride | 908863-44-5

• 英文名称: (1,2-bis(di(4-methoxyphenyl)phosphino)ethane)platinum(II)dichloride
• CAS: 908863-44-5
• 化学式: C₃₀H₃₂Cl₂O₄P₂Pt
• 分子量: 784.515
• InChiKey: FGZXTGBIHWUPHI-UHFFFAOYSA-L

计算性质

• 辛醇/水分配系数(LogP)：
  None
• 重原子数：
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• 可旋转键数：
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• 环数：
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• sp3杂化的碳原子比例：
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• 拓扑面积：
  None
• 氢给体数：
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• 氢受体数：
  None

反应信息

• 作为反应物：
  描述：

  (1,2-bis(di(4-methoxyphenyl)phosphino)ethane)platinum(II)dichloride 、 1,2-bis[bis(4-methoxyphenyl)phosphanyl]ethane 以 二氯甲烷 为溶剂， 以37%的产率得到bis(1,2-bis(di(4-methoxyphenyl)phosphino)ethane)platinum(II) dichloride
  参考文献：
  名称：

  Coordination chemistry of 1,2-bis{di-(4-methoxyphenyl)phosphino}ethane (L-L) to nickel, palladium and platinum: Single crystal structures of [MCl2(L-L)] (M=Ni, Pd)

  摘要：

  Square planar Ni(II), Pd(II) and Pt(II) complexes of the para-methoxy derivatised analogue of dppe, 1,2-bis{di-(4-methoxyphenyl)phosphino}ethane (L-L), [MCl2(L-L)] and [M(L-L)(2)]Cl-2 (M = Ni, Pd, Pt) are readily prepared, and have been characterised by elemental analysis, IR and NMR spectroscopies. The structures of [NiCl2(L-L)] and [PdCl2(L-L)] have been determined by single-crystal X-ray diffraction. (c) 2006 Elsevier B.V. All rights reserved.

  DOI：

  10.1016/j.ica.2006.02.016
• 作为产物：
  描述：

  bis(acetonitrile)dichloroplatinum(II) 、 1,2-bis[bis(4-methoxyphenyl)phosphanyl]ethane 以 二氯甲烷 为溶剂， 以26%的产率得到(1,2-bis(di(4-methoxyphenyl)phosphino)ethane)platinum(II)dichloride
  参考文献：
  名称：

  Coordination chemistry of 1,2-bis{di-(4-methoxyphenyl)phosphino}ethane (L-L) to nickel, palladium and platinum: Single crystal structures of [MCl2(L-L)] (M=Ni, Pd)

  摘要：

  Square planar Ni(II), Pd(II) and Pt(II) complexes of the para-methoxy derivatised analogue of dppe, 1,2-bis{di-(4-methoxyphenyl)phosphino}ethane (L-L), [MCl2(L-L)] and [M(L-L)(2)]Cl-2 (M = Ni, Pd, Pt) are readily prepared, and have been characterised by elemental analysis, IR and NMR spectroscopies. The structures of [NiCl2(L-L)] and [PdCl2(L-L)] have been determined by single-crystal X-ray diffraction. (c) 2006 Elsevier B.V. All rights reserved.

  DOI：

  10.1016/j.ica.2006.02.016